講題：RF system level design for wireless and wired applications using visual system simulator (VSS)
時間：2009年12月22日(星期二) 10:00-11:30
地點：工四館528室
演講大綱:
Learn how to take advantage of complex envelope simulations to:
1. Perform end-to-end bit error rate (BER) simulations
a. Include the effects of oscillator phase noise
b. Account for adjacent channel interference, inter-modulation products and CW interferers
c. Introduce amplitude and phase imbalance as well as DC-offset
d. Etc….
2. Drive “real world” circuit designs with a complex modulated signals to measure:
a. Adjacent channel power ratio (ACPR)
b. Error vector magnitude (EVM)
c. Complementary cumulative distribution function (CCDF)
講者: Joel Kirshman
Joel Kirshman is the Market Segment Manager, Wireless System Design at AWR Corp. He has been with AWR for 9 years specializing in system design. Prior joining AWR he worked for a small EDA company (of the name Elanix) for four years . He participated in the development and support of Elanix’s system design tool SystemView. He also has 8 years of experience working for the Aerospace Corporation in Los Angles, CA.